Nissan Pathfinder (2007 year). Manual - part 136
COMBINATION METERS
DI-11
C
D
E
F
G
H
I
J
L
M
A
B
DI
2007 Pathfinder
Self-Diagnosis Mode of Combination Meter
EKS00FY1
SELF-DIAGNOSIS FUNCTION
The following items can be checked during Combination Meter Self-Diagnosis Mode.
●
Gauge sweep and present gauge values.
●
Illuminates all odometer/trip meters and A/T indicator segments.
●
Illuminates all micro controlled lamps/LEDs regardless of switch position.
●
Displays estimated present battery voltage.
●
Displays seat belt buckle switch LH status.
HOW TO INITIATE COMBINATION METER SELF-DIAGNOSIS MODE
NOTE:
Once entered, Combination Meter Self-Diagnosis Mode will function with the ignition switch in ON or START.
Combination Meter Self-Diagnosis Mode will exit upon turning the ignition switch to OFF or ACC.
To initiate Combination Meter Self-Diagnosis Mode, refer to the following procedure.
1.
Turn the ignition switch ON, while pressing the odometer/trip meter switch for 5 - 8 seconds. When the
diagnosis function is activated, the odometer/trip meter will display tESt.
NOTE:
Check combination meter power supply and ground circuit when self-diagnosis mode of combination
meter does not start. Refer to
DI-18, "Power Supply and Ground Circuit Inspection"
. Replace combination
meter if normal. Refer to
COMBINATION METER SELF-DIAGNOSIS MODE FUNCTIONS
To interpret Combination Meter Self-Diagnosis Mode functions, refer to the following table.
Event
Odometer Display
Description of Test/Data
Notes:
Odometer/trip meter A/B
switch held from 5 to 8
seconds (or until
released)
tESt
Initiating self-diagnosis mode
Next test requested
GAGE
Performs sweep of all
gauges, then displays
present gauge values.
Performs checksum tests
on ROM and EE.
Gauges sweep within 10 sec-
onds
Next test requested
(All segments illuminated)
Lights all odometer/trip
meter segments.
Initiating self-diagnosis mode
complete
Next test requested
bulb
Illuminates all micro-con-
trolled lamps/LEDs
regardless of SW configu-
ration.
Odometer/trip meter A/B
switch engaged and
released = next test
requested
rXXXX, FAIL
Return to normal opera-
tion of all lamps/LEDs and
displays hex ROM rev. If
a ROM checksum fault
exists, display alternates
between "r XXXX" and
"FAIL".
Next test requested
nrXXXX
Displays hex ROM rev as
stored in NVM.
Next test requested
EE XX, FAIL
Hex EE level. If EE
checksum fault exists,
display alternates
between "EE XX" and
"FAIL".
Next test requested
dtXXXX
Hex coding of final manu-
facturing test date.